SYSTEM AND CONFIGURATION ENABLING PROGRAMMABLE INTEGRATIVE SYSTEM MARGIN TEST

PROBLEM TO BE SOLVED: To provide a system for a margin test of selected components and subsystems in electronic systems of computer systems. SOLUTION: The system comprises a base board management controller (BMC) inside an electronic system to be tested and a digital parameter adjuster communicating...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CHHEDA SACHIN N, ROBERTSON NAYSEN JESSE, PERCER BENJAMIN THOMAS
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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