TESTING APPARATUS FOR SOLID-STATE IMAGING DEVICE, REPEATER, AND OPTICAL MODULE

PROBLEM TO BE SOLVED: To provide a testing apparatus which is easy in positioning an optical system for irradiating a solid-state imaging device with the light for testing, and is capable of performing highly efficient testing. SOLUTION: The testing apparatus comprises an optical module 35 for irrad...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	TAMAI SHINGO
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES
Online-Zugang:	Volltext bestellen
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