TESTING APPARATUS FOR SOLID-STATE IMAGING DEVICE, REPEATER, AND OPTICAL MODULE

PROBLEM TO BE SOLVED: To provide a testing apparatus which is easy in positioning an optical system for irradiating a solid-state imaging device with the light for testing, and is capable of performing highly efficient testing. SOLUTION: The testing apparatus comprises an optical module 35 for irrad...

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1. Verfasser: TAMAI SHINGO
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a testing apparatus which is easy in positioning an optical system for irradiating a solid-state imaging device with the light for testing, and is capable of performing highly efficient testing. SOLUTION: The testing apparatus comprises an optical module 35 for irradiating the light-receiving face of a solid-state imaging device with the light from a light source through a pinhole, a probe-card 20 having contact needles for contacting respective pads of the solid-state imaging device, and a motor 30 with a holding arm 31 for transferring the optical module 35 to a prescribed position to the solid-state imaging device to be tested through an opening 20h possessed by the probe-card 20 whose contact needles 21 are in contact with the pads of the solid-state imaging device to be tested. COPYRIGHT: (C)2004,JPO&NCIPI