DEFECT MARK MARKING METHOD, AND METAL STRIP WITH DEFECT MARK MARKED THEREON

PROBLEM TO BE SOLVED: To provide a defect marking method by which a metal strip is carried, defects are detected while measuring the length of the metal strip in the longitudinal direction, defect marks are marked at positions of the defects, the longitudinal positions are recorded in a recording me...

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1. Verfasser: TOMURA YASUO
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a defect marking method by which a metal strip is carried, defects are detected while measuring the length of the metal strip in the longitudinal direction, defect marks are marked at positions of the defects, the longitudinal positions are recorded in a recording means, and the corresponding marks are checked based on the information on the longitudinal positions of the defect marks recorded in the recording means in a subsequent step, and to provide the metal strip on which the defect marks are marked. SOLUTION: In the defect mark marking method, at least one reference mark at the known longitudinal position is marked on a metal strip together with the marking of the defect mark. COPYRIGHT: (C)2004,JPO&NCIPI