SUPERIMPOSED CURRENT ADJUSTMENT METHOD IN WEIL COMBINATION TEST

PROBLEM TO BE SOLVED: To perform fine di/dt adjustment on a Weil circuit current in the vicinity of a zero point of a short-circuit current in the case of only the value of the Weil circuit current increasing. SOLUTION: A Weil combination test circuit comprises a current source circuit 1 for passing a main current I through a tested circuit breaker CBT and a Weil circuit (voltage source circuit) 2, the Weil circuit 2 having a vibration current circuit 4 for superimposing a high-frequency vibration current on the tested circuit breaker when cutting off the main current I and a circuit 5 for transient voltage adjustment parallel-connected to the tested circuit breaker. When respective parameter values of a transient recovery voltage and the value of frequency of a current Ics of the Weil circuit are the same as their standard values but the value of the current ics of the Weil circuit does not agree with its standard value, a resistance R2 of mΩ order is set in series with a discharge gap "gap" in the Weil circuit 2, thereby reducing the value of the current Ics to decrease the di/dt, thus facilitating the operation of the di/dt based on the fine adjustment of the current Ics. COPYRIGHT: (C)2004,JPO&NCIPI