JITTER MEASURING APPARATUS AND JITTER MEASURING METHOD

PROBLEM TO BE SOLVED: To make accurately measurable a pattern depending jitter. SOLUTION: A waveform information acquiring unit 23 acquires a data signal Dr to be measured outputted from a measurement object 1 receiving a data signal Dt outputted from a pattern generating unit 22 and waveform information in the same time region of a clock signal CK outputted from a clock generating unit 21. An averaging processing unit 24 applies averaging processing to the acquired waveform information to eliminate a random noise jitter component of the data signal Dr to be measured and the clock signal CK. A phase difference detecting unit 25 obtains a phase difference of the clock signal and the data signal to be measured from which random noise jitter is eliminated for every bit. A frequency band limiting processing unit 26 applies prescribed frequency band limiting processing to the information of the phase difference obtained by the phase difference detecting unit 25, and a measurement result outputting unit 27 outputs a result of the frequency band limiting processing as a pattern depending jitter generated from a measurement object 1 with respect to the data signal Dt. COPYRIGHT: (C)2004,JPO&NCIPI