OBSERVATION APPARATUS

PROBLEM TO BE SOLVED: To provide an observation apparatus capable of imaging an object with excellent picture quality. SOLUTION: This observation apparatus 1 is equipped with an observation chamber 4 connected to a container 1, a camera 2 for imaging the object 100 put in the container 11 through th...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser:	KANEKAWA AKIHIRO
Format:	Patent
Sprache:	eng
Schlagworte:	ACCESSORIES THEREFOR APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM BASIC ELECTRIC ELEMENTS BLASTING CHEMICAL SURFACE TREATMENT CHEMISTRY CINEMATOGRAPHY COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING MATERIAL WITH METALLIC MATERIAL COATING METALLIC MATERIAL DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS,IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KINDOF FURNACE DIFFUSION TREATMENT OF METALLIC MATERIAL ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY ELECTROGRAPHY FURNACES HEATING HOLOGRAPHY INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES KILNS LIGHTING MANUFACTURE OF IRON OR STEEL MEASURING MECHANICAL ENGINEERING METALLURGY METALLURGY OF IRON OVENS PHOTOGRAPHY PHYSICS PROCESSING OF PIG-IRON, e.g. REFINING, MANUFACTURE OFWROUGHT-IRON OR STEEL RETORTS SEMICONDUCTOR DEVICES SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION TESTING TREATMENT IN MOLTEN STATE OF FERROUS ALLOYS WEAPONS
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide an observation apparatus capable of imaging an object with excellent picture quality. SOLUTION: This observation apparatus 1 is equipped with an observation chamber 4 connected to a container 1, a camera 2 for imaging the object 100 put in the container 11 through the observation chamber 4, and a gas introduction part 7 for introducing gas 9 into a cavity of the observation chamber 4. The observation chamber 4 has a pinhole 8 for connecting the cavity of the observation chamber 4 to the inner side of the container 11 and a window material 6 enabling imaging by the camera 2. Consequently, the gas 9 flows in the container through the pinhole 8, so a vapor-deposited material 105 scattered in the container is prevented from sticking on the window material 6 to image the object with good picture quality. COPYRIGHT: (C)2004,JPO