3-DIMENSIONAL MEASUREMENT INSPECTION METHOD AND ITS SYSTEM

PROBLEM TO BE SOLVED: To drastically enhance inspection precision and reduce time for 100% inspection by automatically inspecting an opaque object such as pottery products and tiles. SOLUTION: An inspection system for inspecting the opaque object comprises: a conveyance device moving at a constant s...

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Bibliographische Detailangaben
Hauptverfasser: ITO HISAKUNI, ASANO YOSHINORI, SAKAI AKIRA
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To drastically enhance inspection precision and reduce time for 100% inspection by automatically inspecting an opaque object such as pottery products and tiles. SOLUTION: An inspection system for inspecting the opaque object comprises: a conveyance device moving at a constant speed; an inspection object which is the opaque object placed on the conveyor device; a laser irradiation means positioned above the object for irradiating the object with a laser beam; a CCD camera disposed opposite to the irradiation means, provided with a three dimensional position measuring means receiving reflection light of the laser beam and having a resolution of not less than 1 million pixels; an image processor converting data acquired by point measurement into image information, a judging means for making comparison with reference form information inputted in advance; and an expelling means for expelling the data which falls out of a dimensional precision of the data of the reference form information. COPYRIGHT: (C)2004,JPO