GAS ANALYTICAL SYSTEM AND GAS ANALYTICAL METHOD

PROBLEM TO BE SOLVED: To provide a gas analytical system and a gas analytical method capable of measuring a measuring object gas highly sensitively, and improving identification ability of materials by measuring a micro sample by a plurality of detection means. SOLUTION: This gas analytical system h...

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1. Verfasser: SATAKE TSUKASA
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a gas analytical system and a gas analytical method capable of measuring a measuring object gas highly sensitively, and improving identification ability of materials by measuring a micro sample by a plurality of detection means. SOLUTION: This gas analytical system has a sample capture part 4 for capturing a plurality of measuring object components S0, a chromatographic separation part 5 for separating each component S1, S2of the measuring object components S0captured by the capture part 4, a low-temperature adsorption flocculation part 7 for performing continuously low-temperature adsorption and flocculation of each chromatographically-separated component S1, S2or the like on a flocculation line L extending in the moving direction by being moved to a flocculation point P where each separated component S1, S2or the like is sprayed, and a plurality of analysis parts 8-10 capable of analyzing the components flocculated on the line L by a plurality of different means by arranging each measuring point P8-P10on the line L of the flocculation part 7 and by moving the flocculation part 7 in the same direction as the direction in the flocculation time relative to the measuring points P8-P10. The concentration and the composition of each component S1, S2or the like included in the measuring object gas S can be identified by integrating analysis results of each analysis part 8-10. COPYRIGHT: (C)2004,JPO