SCANNING CIRCUIT

PROBLEM TO BE SOLVED: To provide a scanning circuit capable of realizing the same scanning rate as that of the whole elements being scanned without making the frequency of a scanning pulse higher than that of the whole elements being scanned in the interleaved scanning. SOLUTION: This scanning circu...

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Bibliographische Detailangaben
1. Verfasser: KAKUMOTO KENICHI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a scanning circuit capable of realizing the same scanning rate as that of the whole elements being scanned without making the frequency of a scanning pulse higher than that of the whole elements being scanned in the interleaved scanning. SOLUTION: This scanning circuit is provided with a shift register comprising a plurality of G latch type flip-flops 211_1, 211_2, ..., and scans corresponding elements on the basis of an output of each stage of the shift register. The scanning circuit is provided with a plurality of wirings for supplying a strobe signal to the flip-flops 211_1, 211_2, ... Each of the flip-flops 211_1, 211_2, ..., is divided into a plurality of groups, and the strobe signal is supplied to each of the flip-flops 211_1, 211_2, ..., through a wiring different by each group. COPYRIGHT: (C)2004,JPO