DEVICE FOR PREPARING CIRCUIT, DEVICE FOR PREPARING TEST PATTERN, DEVICE FOR SUPPORTING DESIGN, AND METHOD OF PREPARING TEST PATTERN
PROBLEM TO BE SOLVED: To reduce the number of test patterns and a test time for a boundary scanning register. SOLUTION: This device is constituted of a data processing part 10 and a plurality of information storage parts, and the information storage parts includes a first storage part 11 stored with...
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| creator | AKAHA MASASHI |
| description | PROBLEM TO BE SOLVED: To reduce the number of test patterns and a test time for a boundary scanning register. SOLUTION: This device is constituted of a data processing part 10 and a plurality of information storage parts, and the information storage parts includes a first storage part 11 stored with circuit information for a targeted circuit, a second storage part 12 stored with group classification information (group information) for classifying external terminals of a non-scanning test circuit, a third storage part 13 stored with library information of a BS cell, a fourth storage part 14 stored with connection rule information for the BS cell, a fifth storage part 15 stored with test pattern information for the targeted circuit, and a sixth storage part 16 stored with protocol information for boundary scanning test. A prescribed data processing program is executed in the data processing part 10, based on the informations stored in the first - the sixth storage parts 11-16. COPYRIGHT: (C)2004,JPO |
| format | Patent |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | DEVICE FOR PREPARING CIRCUIT, DEVICE FOR PREPARING TEST PATTERN, DEVICE FOR SUPPORTING DESIGN, AND METHOD OF PREPARING TEST PATTERN |
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