METHOD FOR MEASURING RELATIVE POSITION OF FIRST IMAGING DEVICE AND SECOND IMAGING DEVICE

PROBLEM TO BE SOLVED: To determine the relative position of a first imaging device and a second imaging device by a simple method. SOLUTION: A group of mutually different reference patterns 16 and a basic pattern 18 are imaged by the second imaging device functioning as a master and each reference p...

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Bibliographische Detailangaben
Hauptverfasser:	ZINTZEN BERNHARD, KOEHLER THOMAS
Format:	Patent
Sprache:	eng
Schlagworte:	APPARATUS SPECIALLY ADAPTED THEREFOR CINEMATOGRAPHY CORRECTION OF TYPOGRAPHICAL ERRORS ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY ELECTROGRAPHY HOLOGRAPHY i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME LINING MACHINES MATERIALS THEREFOR ORIGINALS THEREFOR PERFORMING OPERATIONS PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION PRINTING PROCESSES FOR THE MANUFACTURE OR REPRODUCTION OF PRINTINGSURFACES SELECTIVE PRINTING MECHANISMS STAMPS TRANSPORTING TYPEWRITERS
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