METHOD FOR MEASURING RELATIVE POSITION OF FIRST IMAGING DEVICE AND SECOND IMAGING DEVICE
PROBLEM TO BE SOLVED: To determine the relative position of a first imaging device and a second imaging device by a simple method. SOLUTION: A group of mutually different reference patterns 16 and a basic pattern 18 are imaged by the second imaging device functioning as a master and each reference p...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | ZINTZEN BERNHARD KOEHLER THOMAS |
| description | PROBLEM TO BE SOLVED: To determine the relative position of a first imaging device and a second imaging device by a simple method. SOLUTION: A group of mutually different reference patterns 16 and a basic pattern 18 are imaged by the second imaging device functioning as a master and each reference pattern 16 of the group is assigned uniquely to one relative position at the time. At least one test pattern is imaged over the basic pattern by the first imaging device whose relative position is to be measured and thus a combination pattern 24 is formed. The reference pattern 16 of the group having an area coverage coinciding with the area coverage of the combination pattern 24 is identified. Since one relative position is assigned uniquely to the identified reference pattern 16 of the group, the relative position of the first imaging device and the second imaging device is identified. COPYRIGHT: (C)2004,JPO |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2003307854A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2003307854A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2003307854A3</originalsourceid><addsrcrecordid>eNrjZIjwdQ3x8HdRcPMPUvB1dQwODfL0c1cIcvVxDPEMc1UI8A_2DPH091Pwd1Nw8wwKDlHw9HV0BylxcQ3zdHZVcPRzUQh2dfYHUqgyPAysaYk5xam8UJqbQcnNNcTZQze1ID8-tbggMTk1L7Uk3ivAyMDA2NjA3MLUxNGYKEUAM1YxWw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD FOR MEASURING RELATIVE POSITION OF FIRST IMAGING DEVICE AND SECOND IMAGING DEVICE</title><source>esp@cenet</source><creator>ZINTZEN BERNHARD ; KOEHLER THOMAS</creator><creatorcontrib>ZINTZEN BERNHARD ; KOEHLER THOMAS</creatorcontrib><description>PROBLEM TO BE SOLVED: To determine the relative position of a first imaging device and a second imaging device by a simple method. SOLUTION: A group of mutually different reference patterns 16 and a basic pattern 18 are imaged by the second imaging device functioning as a master and each reference pattern 16 of the group is assigned uniquely to one relative position at the time. At least one test pattern is imaged over the basic pattern by the first imaging device whose relative position is to be measured and thus a combination pattern 24 is formed. The reference pattern 16 of the group having an area coverage coinciding with the area coverage of the combination pattern 24 is identified. Since one relative position is assigned uniquely to the identified reference pattern 16 of the group, the relative position of the first imaging device and the second imaging device is identified. COPYRIGHT: (C)2004,JPO</description><edition>7</edition><language>eng</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; CINEMATOGRAPHY ; CORRECTION OF TYPOGRAPHICAL ERRORS ; ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRICITY ; ELECTROGRAPHY ; HOLOGRAPHY ; i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME ; LINING MACHINES ; MATERIALS THEREFOR ; ORIGINALS THEREFOR ; PERFORMING OPERATIONS ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS ; PICTORIAL COMMUNICATION, e.g. TELEVISION ; PRINTING ; PROCESSES FOR THE MANUFACTURE OR REPRODUCTION OF PRINTINGSURFACES ; SELECTIVE PRINTING MECHANISMS ; STAMPS ; TRANSPORTING ; TYPEWRITERS</subject><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20031031&DB=EPODOC&CC=JP&NR=2003307854A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20031031&DB=EPODOC&CC=JP&NR=2003307854A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZINTZEN BERNHARD</creatorcontrib><creatorcontrib>KOEHLER THOMAS</creatorcontrib><title>METHOD FOR MEASURING RELATIVE POSITION OF FIRST IMAGING DEVICE AND SECOND IMAGING DEVICE</title><description>PROBLEM TO BE SOLVED: To determine the relative position of a first imaging device and a second imaging device by a simple method. SOLUTION: A group of mutually different reference patterns 16 and a basic pattern 18 are imaged by the second imaging device functioning as a master and each reference pattern 16 of the group is assigned uniquely to one relative position at the time. At least one test pattern is imaged over the basic pattern by the first imaging device whose relative position is to be measured and thus a combination pattern 24 is formed. The reference pattern 16 of the group having an area coverage coinciding with the area coverage of the combination pattern 24 is identified. Since one relative position is assigned uniquely to the identified reference pattern 16 of the group, the relative position of the first imaging device and the second imaging device is identified. COPYRIGHT: (C)2004,JPO</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>CINEMATOGRAPHY</subject><subject>CORRECTION OF TYPOGRAPHICAL ERRORS</subject><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRICITY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME</subject><subject>LINING MACHINES</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PERFORMING OPERATIONS</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><subject>PICTORIAL COMMUNICATION, e.g. TELEVISION</subject><subject>PRINTING</subject><subject>PROCESSES FOR THE MANUFACTURE OR REPRODUCTION OF PRINTINGSURFACES</subject><subject>SELECTIVE PRINTING MECHANISMS</subject><subject>STAMPS</subject><subject>TRANSPORTING</subject><subject>TYPEWRITERS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZIjwdQ3x8HdRcPMPUvB1dQwODfL0c1cIcvVxDPEMc1UI8A_2DPH091Pwd1Nw8wwKDlHw9HV0BylxcQ3zdHZVcPRzUQh2dfYHUqgyPAysaYk5xam8UJqbQcnNNcTZQze1ID8-tbggMTk1L7Uk3ivAyMDA2NjA3MLUxNGYKEUAM1YxWw</recordid><startdate>20031031</startdate><enddate>20031031</enddate><creator>ZINTZEN BERNHARD</creator><creator>KOEHLER THOMAS</creator><scope>EVB</scope></search><sort><creationdate>20031031</creationdate><title>METHOD FOR MEASURING RELATIVE POSITION OF FIRST IMAGING DEVICE AND SECOND IMAGING DEVICE</title><author>ZINTZEN BERNHARD ; KOEHLER THOMAS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2003307854A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2003</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>CINEMATOGRAPHY</topic><topic>CORRECTION OF TYPOGRAPHICAL ERRORS</topic><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRICITY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME</topic><topic>LINING MACHINES</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PERFORMING OPERATIONS</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><topic>PICTORIAL COMMUNICATION, e.g. TELEVISION</topic><topic>PRINTING</topic><topic>PROCESSES FOR THE MANUFACTURE OR REPRODUCTION OF PRINTINGSURFACES</topic><topic>SELECTIVE PRINTING MECHANISMS</topic><topic>STAMPS</topic><topic>TRANSPORTING</topic><topic>TYPEWRITERS</topic><toplevel>online_resources</toplevel><creatorcontrib>ZINTZEN BERNHARD</creatorcontrib><creatorcontrib>KOEHLER THOMAS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZINTZEN BERNHARD</au><au>KOEHLER THOMAS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD FOR MEASURING RELATIVE POSITION OF FIRST IMAGING DEVICE AND SECOND IMAGING DEVICE</title><date>2003-10-31</date><risdate>2003</risdate><abstract>PROBLEM TO BE SOLVED: To determine the relative position of a first imaging device and a second imaging device by a simple method. SOLUTION: A group of mutually different reference patterns 16 and a basic pattern 18 are imaged by the second imaging device functioning as a master and each reference pattern 16 of the group is assigned uniquely to one relative position at the time. At least one test pattern is imaged over the basic pattern by the first imaging device whose relative position is to be measured and thus a combination pattern 24 is formed. The reference pattern 16 of the group having an area coverage coinciding with the area coverage of the combination pattern 24 is identified. Since one relative position is assigned uniquely to the identified reference pattern 16 of the group, the relative position of the first imaging device and the second imaging device is identified. COPYRIGHT: (C)2004,JPO</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_JP2003307854A |
| source | esp@cenet |
| subjects | APPARATUS SPECIALLY ADAPTED THEREFOR CINEMATOGRAPHY CORRECTION OF TYPOGRAPHICAL ERRORS ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY ELECTROGRAPHY HOLOGRAPHY i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME LINING MACHINES MATERIALS THEREFOR ORIGINALS THEREFOR PERFORMING OPERATIONS PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION PRINTING PROCESSES FOR THE MANUFACTURE OR REPRODUCTION OF PRINTINGSURFACES SELECTIVE PRINTING MECHANISMS STAMPS TRANSPORTING TYPEWRITERS |
| title | METHOD FOR MEASURING RELATIVE POSITION OF FIRST IMAGING DEVICE AND SECOND IMAGING DEVICE |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T01%3A32%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ZINTZEN%20BERNHARD&rft.date=2003-10-31&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2003307854A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |