ELECTROMAGNETIC WAVE EFFECT INSPECTION SYSTEM

PROBLEM TO BE SOLVED: To provide an electromagnetic wave effect inspection system for easily positioning an electromagnetic wave radiating device to an inspection point. SOLUTION: Electromagnetic wave radiation axes P, Q, and R are placed orthogonal to a device axis 14 intersecting a main part 15 of...

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Bibliographische Detailangaben
Hauptverfasser: YOKOYAMA HIROYUKI, SENCHI MASATO, SHIMOOKI YOJI, OIWA KATSUHIKO
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide an electromagnetic wave effect inspection system for easily positioning an electromagnetic wave radiating device to an inspection point. SOLUTION: Electromagnetic wave radiation axes P, Q, and R are placed orthogonal to a device axis 14 intersecting a main part 15 of the device 1 to be inspected such that the radiation axes superimpose the main part 15. The electromagnetic wave effect inspection system A inspects an effect of electromagnetic wave after positioning the electromagnetic wave radiating device 3 at the inspection point where opening surfaces 31, 32 and 33 are apart from the main part 15 respectively at a predetermined distance. Pyramid-shape horn antennas 34, 35 and 36 are installed such that the opening surfaces 31, 32 and 33 have the same height to a center. Rails 41 and 42 are laid on a floor 40 so as to be parallel to the device axis 14 and have a predetermined distance respectively between the opening surfaces 31, 32 and 33 and the main part 15. A wheel for guiding the electromagnetic wave radiating device 3 is provided on a lower part of the electromagnetic wave radiating device along the rails 41 and 42. COPYRIGHT: (C)2004,JPO