BRAGG REFLECTION CONDITION SIMULATION APPARATUS AND BRAGG REFLECTION MEASUREMENT SYSTEM

PROBLEM TO BE SOLVED: To provide a new Bragg reflection condition simulation apparatus and a measurement system for rapidly, easily and accurately obtaining an arbitrary Bragg reflection condition of a desired crystal sample by using a computer and measuring actual Bragg reflection by using the cond...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ENDO KAMIHISA, HARADA JINPEI, OZAWA TETSUYA, YOKOYAMA RYOICHI
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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