BRAGG REFLECTION CONDITION SIMULATION APPARATUS AND BRAGG REFLECTION MEASUREMENT SYSTEM

PROBLEM TO BE SOLVED: To provide a new Bragg reflection condition simulation apparatus and a measurement system for rapidly, easily and accurately obtaining an arbitrary Bragg reflection condition of a desired crystal sample by using a computer and measuring actual Bragg reflection by using the condition. SOLUTION: The Bragg reflection condition simulation apparatus for X rays or particle beams from the crystal sample is provided with an input means (1) for inputting a lattice constant and a crystal orientation of the crystal sample, a means (2) for calculating a crystal orientation matrix U in a UB matrix by using the crystal orientation, a means (3) for calculating a crystal lattice matrix B in the UB matrix by using the lattice constant, and a means (4) for calculating a rotation matrix R representing a rotation angle of the other rotational axis of a diffraction measurement apparatus meeting a diffraction condition of the arbitrarily specified Bragg reflection by using the crystal orientation matrix U, the crystal lattice matrix B and a rotational angle of one rotational axis arbitrarily specified among a plurality of rotational axes of the diffraction measurement apparatus. COPYRIGHT: (C)2004,JPO