METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device that is polished without reducing the polishing rate, when conducting polishing by a CMP method using a polishing pad having high hardness. SOLUTION: An oxide film 14, whose peripheral section 14a is thicker than a cen...

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Hauptverfasser: YAMAUCHI SHOICHI, URAGAMI YASUSHI, NODA MICHITAKA
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creator YAMAUCHI SHOICHI
URAGAMI YASUSHI
NODA MICHITAKA
description PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device that is polished without reducing the polishing rate, when conducting polishing by a CMP method using a polishing pad having high hardness. SOLUTION: An oxide film 14, whose peripheral section 14a is thicker than a central section and in a convex shape, is formed on a semiconductor wafer 1. Subsequently, patterning is performed on the oxide film 14 by photolithography and an etching process. Then, trenches 2 are formed, and a filling material is formed on the semiconductor wafer including the inside of the trenches 2. Next, the filling material on the semiconductor wafer 1 is polished, using the oxide film 14 as a stopper by the CMP method using the polishing pad of high hardness. At this point, since the peripheral section is into a convex shape, a polished surface is prevented from assuming a convex shape during polishing. Thus, polishing is performed, without making the polishing rate reduced. COPYRIGHT: (C)2003,JPO
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2003273051A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2003273051A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2003273051A3</originalsourceid><addsrcrecordid>eNrjZNDxdQ3x8HdR8HdT8HX0C3VzdA4JDfL0c1cIdvX1dPb3cwl1DvEPUnBxDfN0duVhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGBsZG5sYGpoaOxkQpAgDszSWu</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE</title><source>esp@cenet</source><creator>YAMAUCHI SHOICHI ; URAGAMI YASUSHI ; NODA MICHITAKA</creator><creatorcontrib>YAMAUCHI SHOICHI ; URAGAMI YASUSHI ; NODA MICHITAKA</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device that is polished without reducing the polishing rate, when conducting polishing by a CMP method using a polishing pad having high hardness. SOLUTION: An oxide film 14, whose peripheral section 14a is thicker than a central section and in a convex shape, is formed on a semiconductor wafer 1. Subsequently, patterning is performed on the oxide film 14 by photolithography and an etching process. Then, trenches 2 are formed, and a filling material is formed on the semiconductor wafer including the inside of the trenches 2. Next, the filling material on the semiconductor wafer 1 is polished, using the oxide film 14 as a stopper by the CMP method using the polishing pad of high hardness. At this point, since the peripheral section is into a convex shape, a polished surface is prevented from assuming a convex shape during polishing. Thus, polishing is performed, without making the polishing rate reduced. COPYRIGHT: (C)2003,JPO</description><edition>7</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20030926&amp;DB=EPODOC&amp;CC=JP&amp;NR=2003273051A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20030926&amp;DB=EPODOC&amp;CC=JP&amp;NR=2003273051A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YAMAUCHI SHOICHI</creatorcontrib><creatorcontrib>URAGAMI YASUSHI</creatorcontrib><creatorcontrib>NODA MICHITAKA</creatorcontrib><title>METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE</title><description>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device that is polished without reducing the polishing rate, when conducting polishing by a CMP method using a polishing pad having high hardness. SOLUTION: An oxide film 14, whose peripheral section 14a is thicker than a central section and in a convex shape, is formed on a semiconductor wafer 1. Subsequently, patterning is performed on the oxide film 14 by photolithography and an etching process. Then, trenches 2 are formed, and a filling material is formed on the semiconductor wafer including the inside of the trenches 2. Next, the filling material on the semiconductor wafer 1 is polished, using the oxide film 14 as a stopper by the CMP method using the polishing pad of high hardness. At this point, since the peripheral section is into a convex shape, a polished surface is prevented from assuming a convex shape during polishing. Thus, polishing is performed, without making the polishing rate reduced. COPYRIGHT: (C)2003,JPO</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNDxdQ3x8HdR8HdT8HX0C3VzdA4JDfL0c1cIdvX1dPb3cwl1DvEPUnBxDfN0duVhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGBsZG5sYGpoaOxkQpAgDszSWu</recordid><startdate>20030926</startdate><enddate>20030926</enddate><creator>YAMAUCHI SHOICHI</creator><creator>URAGAMI YASUSHI</creator><creator>NODA MICHITAKA</creator><scope>EVB</scope></search><sort><creationdate>20030926</creationdate><title>METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE</title><author>YAMAUCHI SHOICHI ; URAGAMI YASUSHI ; NODA MICHITAKA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2003273051A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2003</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>YAMAUCHI SHOICHI</creatorcontrib><creatorcontrib>URAGAMI YASUSHI</creatorcontrib><creatorcontrib>NODA MICHITAKA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YAMAUCHI SHOICHI</au><au>URAGAMI YASUSHI</au><au>NODA MICHITAKA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE</title><date>2003-09-26</date><risdate>2003</risdate><abstract>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device that is polished without reducing the polishing rate, when conducting polishing by a CMP method using a polishing pad having high hardness. SOLUTION: An oxide film 14, whose peripheral section 14a is thicker than a central section and in a convex shape, is formed on a semiconductor wafer 1. Subsequently, patterning is performed on the oxide film 14 by photolithography and an etching process. Then, trenches 2 are formed, and a filling material is formed on the semiconductor wafer including the inside of the trenches 2. Next, the filling material on the semiconductor wafer 1 is polished, using the oxide film 14 as a stopper by the CMP method using the polishing pad of high hardness. At this point, since the peripheral section is into a convex shape, a polished surface is prevented from assuming a convex shape during polishing. Thus, polishing is performed, without making the polishing rate reduced. COPYRIGHT: (C)2003,JPO</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
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