OPTICAL METHOD AND APPARATUS FOR PARTICLE DISPLACEMENT
PROBLEM TO BE SOLVED: To provide an optical method and an optical apparatus for displacement of particles (P). SOLUTION: The optical apparatus for displacement of the particles (P) is provided with both a substrate (6) in which at least one strip (5) made of at least one thin film is accumulated and...
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| creator | CHATON PATRICK GETIN STEPHANE |
| description | PROBLEM TO BE SOLVED: To provide an optical method and an optical apparatus for displacement of particles (P). SOLUTION: The optical apparatus for displacement of the particles (P) is provided with both a substrate (6) in which at least one strip (5) made of at least one thin film is accumulated and the strip (5) having an optical thickness gradient along its axis line so that the displacement of the particles (P) may occur along the axis line of the strip (5) when electromagnetic waves (L) inadiate the apparatus. This invention may be applied to the classification and/or analysis of the particles. COPYRIGHT: (C)2003,JPO |
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SOLUTION: The optical apparatus for displacement of the particles (P) is provided with both a substrate (6) in which at least one strip (5) made of at least one thin film is accumulated and the strip (5) having an optical thickness gradient along its axis line so that the displacement of the particles (P) may occur along the axis line of the strip (5) when electromagnetic waves (L) inadiate the apparatus. This invention may be applied to the classification and/or analysis of the particles. 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| subjects | BASIC ELECTRIC ELEMENTS DEVICES USING STIMULATED EMISSION ELECTRICITY GAMMA RAY OR X-RAY MICROSCOPES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES IRRADIATION DEVICES MEASURING NUCLEAR ENGINEERING NUCLEAR PHYSICS PHYSICS TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR TESTING |
| title | OPTICAL METHOD AND APPARATUS FOR PARTICLE DISPLACEMENT |
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