ANALYSIS METHOD FOR NONLINEAR EQUATION, ANALYSIS APPARATUS THEREFOR, PROGRAM AND RECORDING MEDIUM

PROBLEM TO BE SOLVED: To speed up an analysis of a nonlinear equation by automatically setting an optimum convergence criterion, in the inside of a program. SOLUTION: Method-analyzing device characteristics of a semiconductor by solving the nonlinear equation, using a iterative solution, comprise a step of inputting predetermined conditions related to the device characteristics, a step of setting a determinant composed of a sparse array by substituting the predetermined conditions, a step of linearizing the determinant to acquire a matrix of solution by using a repetitive loop, a step of determining whether the matrix of solution satisfies the convergence criterion of a linear equation, a step of changing the convergence criterion of the linear equation, based on the matrix of solution and a step of determining as to whether the matrix of solution by linearizing satisfies the convergence criterion of the nonlinear equation, whereby it becomes possible to reduce in number of repetitive times, to satisfy the convergence criterion of the nonlinear equation and extensively reduce calculation time. COPYRIGHT: (C)2003,JPO