PRECURSOR FOR HEAPING ZIRCONIUM OXIDE THIN FILM AND HAFNIUM OXIDE THIN FILM

PROBLEM TO BE SOLVED: To provide a hafnium precursor able to be used for heaping a hafnium metal oxide thin film by CVD or ALCVD (atomic layer chemical vapor deposition). SOLUTION: A method for producing the precursor for a thin film formed by a chemical vapor deposition method is comprised of a ste...

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Bibliographische Detailangaben
Hauptverfasser: ZHUANG WEI-WEI, EVANS DAVID RUSSELL
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a hafnium precursor able to be used for heaping a hafnium metal oxide thin film by CVD or ALCVD (atomic layer chemical vapor deposition). SOLUTION: A method for producing the precursor for a thin film formed by a chemical vapor deposition method is comprised of a step to form a solution by mixing ZCl4 (Z is an element selected from the group consisting of hafnium and zirconium) with H(tmhd)3 solvent and a hydrocarbon solvent such as benzene and the like, a step to reflux the solvent during 12 hours in argon atmosphere, a step to generate a solid compound by removing the solvent in vacuum and a step to sublime the compound in vacuum of about 0.1 mmHg at 200 deg.C.