METHOD OF FORMING SILICON OXIDE FILM OF SEMICONDUCTOR DEVICE AND METHOD OF FORMING WIRING EQUIPPED WITH SILICON OXIDE FILM

PROBLEM TO BE SOLVED: To provide a method of forming a semiconductor device which is capable of insulating fine conductive patterns from one another without producing any defective in a process. SOLUTION: An antioxidant film 36 which is capable of continuously preventing an oxidizing agent from perm...

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Hauptverfasser: RI CHUHAN, KIN MEITETSU, GU SHUZEN, KIM HONG-GUEN, HONG EUN-KEE
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creator RI CHUHAN
KIN MEITETSU
GU SHUZEN
KIM HONG-GUEN
HONG EUN-KEE
description PROBLEM TO BE SOLVED: To provide a method of forming a semiconductor device which is capable of insulating fine conductive patterns from one another without producing any defective in a process. SOLUTION: An antioxidant film 36 which is capable of continuously preventing an oxidizing agent from permeating is formed on a conductor pattern 32 and a semiconductor substrate 30. The antioxidant film 36 is coated with a fluid oxide for the formation of a fluid oxide film so as to bury the conductor pattern 32. The fluid oxide film is thermally treated into a silicon oxide film 40. In succession, the silicon oxide film filling up a gap between the antioxidant film 36 and the conductor pattern 32 and the antioxidant film 36 disclosed on the semiconductor substrate 30 are etched so as to form a contact hole 42, so that the wiring of a semiconductor device can be formed.
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title METHOD OF FORMING SILICON OXIDE FILM OF SEMICONDUCTOR DEVICE AND METHOD OF FORMING WIRING EQUIPPED WITH SILICON OXIDE FILM
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