ALUMINIUM HARD MASK FOR DIELECTRIC ETCHING
PROBLEM TO BE SOLVED: To solve a problem arising in the fabrication of vias and trenches in a semiconductor device which have a high aspect ratio, and a problem that etching of these structures having the high aspect ratio is generally difficult due to erosion of a mask pattern during etching. SOLUT...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | PROBLEM TO BE SOLVED: To solve a problem arising in the fabrication of vias and trenches in a semiconductor device which have a high aspect ratio, and a problem that etching of these structures having the high aspect ratio is generally difficult due to erosion of a mask pattern during etching. SOLUTION: The problem is solved by use of an aluminium hard mask for etching of a dielectric layer. |
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