COMPOSITION FOR FORMING GAP FILLING MATERIAL FOR LITHOGRAPHY

PROBLEM TO BE SOLVED: To provide a gap filling material for lithography excellent in property of flattening a substrate with protrusions and recessions such as holes and trenches, causing no intermixing with a resist layer and having dry etching speed larger compared with that of the resist. SOLUTIO...

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Bibliographische Detailangaben
Hauptverfasser: SONE YASUHISA, TAKEI SATOSHI, MIZUSAWA KENICHI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a gap filling material for lithography excellent in property of flattening a substrate with protrusions and recessions such as holes and trenches, causing no intermixing with a resist layer and having dry etching speed larger compared with that of the resist. SOLUTION: A composition for forming the gap filling material containing a polymer solution is used in manufacturing a semiconductor device by a method which consists of coating the substrate having holes with >=1 aspect ratio defined by height/diameter with a resist and transferring an image to the substrate utilizing a lithography process and is used to flatten the substrate surface by coating the substrate therewith before coating it with the resist.