FLUORESCENT X-RAY ANALYZER

PROBLEM TO BE SOLVED: To provide a fluorescent X-ray analyzer which can analyze a sample by conveying the sample to an irradiation position to be irradiated with a primary X-ray and positioning a measuring part of the sample with a simple constitution. SOLUTION: In the fluorescent X-ray analyzer, an...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	SUMII HIROSHI
Format:	Patent
Sprache:	eng
Schlagworte:	GAMMA RAY OR X-RAY MICROSCOPES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES IRRADIATION DEVICES MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING NUCLEAR ENGINEERING NUCLEAR PHYSICS PHYSICS TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR TESTING
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