FLUORESCENT X-RAY ANALYZER

PROBLEM TO BE SOLVED: To provide a fluorescent X-ray analyzer which can analyze a sample by conveying the sample to an irradiation position to be irradiated with a primary X-ray and positioning a measuring part of the sample with a simple constitution. SOLUTION: In the fluorescent X-ray analyzer, an...

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Bibliographische Detailangaben
1. Verfasser:	SUMII HIROSHI
Format:	Patent
Sprache:	eng
Schlagworte:	GAMMA RAY OR X-RAY MICROSCOPES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES IRRADIATION DEVICES MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING NUCLEAR ENGINEERING NUCLEAR PHYSICS PHYSICS TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a fluorescent X-ray analyzer which can analyze a sample by conveying the sample to an irradiation position to be irradiated with a primary X-ray and positioning a measuring part of the sample with a simple constitution. SOLUTION: In the fluorescent X-ray analyzer, an r drive means 37 rotates an r drive shaft 43, thereby to perform both a conveying function of the sample 3 and a positioning function in the r direction of the measuring part. And also, the θ drive shaft 53 of a θ drive means 38 for performing the positioning function in the θ direction of the measuring part and the shaft 43 of the means 37 constitute a concentric double axis.