EDDY-CURRENT FLAW DETECTION TESTING DEVICE
PROBLEM TO BE SOLVED: To provide an eddy-current flaw detection testing device capable of making an analysis required for flaw detection using many parameters while reducing noise components caused by lift-off, without needing to take a null state. SOLUTION: This eddy-current flaw detection testing...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | PROBLEM TO BE SOLVED: To provide an eddy-current flaw detection testing device capable of making an analysis required for flaw detection using many parameters while reducing noise components caused by lift-off, without needing to take a null state. SOLUTION: This eddy-current flaw detection testing device detects the change, generated by a discontinuous part around the surface, of an eddy current induced around the surface of a test object 22 by the AC magnetic field formed by an exciting coil 1a, by the change of the magnetic field detected by a detecting coil 2a, and detects the flaw of the test object 22 on the basis of the change. The device is provided with a means 25 for supplying an alternating current whose frequency is changed continuously or stepwise, to the exciting coil 1a, and detecting means 17a, 18a, 21 for detecting the change of the magnetic field generated by the discontinuous part around the surface, of the eddy current induced to the test object 22. The detecting coil 2a is formed by winding a conductor in triangular shape, setting a direction intersecting the center axis direction of the exciting coil 1a, as the center axis direction. One side of the triangle is disposed on the exciting coil 1a side, and the opposed apex of one side is disposed to be separated from the exciting coil 1a. |
---|