POLYIMIDE FILM AND ITS PRODUCTION METHOD

PROBLEM TO BE SOLVED: To provide a polyimide film improved in the surface defects caused by a polymer-modification product and an imide-modification product; and a production method for the same. SOLUTION: This polyimide film is characterized in that the density of defects caused by a polymer modifi...

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Bibliographische Detailangaben
Hauptverfasser:	GOTO YOSHINORI, OKABASHI MASAKAZU
Format:	Patent
Sprache:	eng
Schlagworte:	AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F,C08G AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING CHEMISTRY COMPOSITIONS BASED THEREON GENERAL PROCESSES OF COMPOUNDING INDEXING SCHEME ASSOCIATED WITH SUBCLASS B29C, RELATING TO PARTICULARARTICLES INDEXING SCHEME ASSOCIATED WITH SUBCLASSES B29B, B29C OR B29D, RELATING TO MOULDING MATERIALS METALLURGY ORGANIC MACROMOLECULAR COMPOUNDS PERFORMING OPERATIONS SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDEDFOR SHAPING OR JOINING OF PLASTICS THEIR PREPARATION OR CHEMICAL WORKING-UP TRANSPORTING WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL WORKING-UP
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a polyimide film improved in the surface defects caused by a polymer-modification product and an imide-modification product; and a production method for the same. SOLUTION: This polyimide film is characterized in that the density of defects caused by a polymer modification product and an imide modification product on the film surface is 6.0×10 /m or lower. The density of defects is obtained by a method comprising exposing the film surface to incandescence or polarized light, counting the number of projections having lengths of at least 300 μm and holes and air bubbles having lengths of at least 75 μm present on the surface of at least 170 m by using a surface inspection apparatus, and calculating the density of defects by using the above-counted number as the number of defects.