MEMBRANE PROBE BLOCK

PROBLEM TO BE SOLVED: To solve problems in a probe block by a conventional technology which comprises a plurality of pins and can not provide satisfying conductivity when electrically connected, has an inclination of a needle head of each of the pins for joining to a test pad sufficiently, to damage...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	SHA TOSON, RAI UTSUKAI, CHIN RYUKIN, KAKU KENGEN, HAN IHO, O MEIKEN, RIN KOCHU, KA KANKEN, RYU BUNGEN
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To solve problems in a probe block by a conventional technology which comprises a plurality of pins and can not provide satisfying conductivity when electrically connected, has an inclination of a needle head of each of the pins for joining to a test pad sufficiently, to damage the test pad and to give trouble in a back-end process in testing, and further cost for repairing the probe block by the conventional technology which is expensive. SOLUTION: A membrane probe block comprises a circuit sub-assembly having a plurality of test pads, and a circuit having a flexible printed circuit unit 502. The block further includes a suspending unit 300. A driver integrated circuit unit 200 is electrically connected to the circuit sub-assembly, and the flexible printed circuit unit 502 is electrically connected to the driver integrated circuit unit 200.