WIRING DESIGN METHOD AND DEVICE THEREOF

PROBLEM TO BE SOLVED: To provide a wiring design method for preventing fusing in wiring caused by an electromigration influence, and to provide a wiring design device. SOLUTION: The wiring branchpoint of a net in a semiconductor integrated circuit is acquired, and a current density value is calculated for each wiring branchpoint for comparing with a current density limit value, thus verifying electromigration. Current density is successively verified from the wiring branchpoint near a source side by checking the connection relationship of wiring from the source side to the direction of a load side. Merely wiring in a portion causing excessive current density is widened to an appropriate wiring with for reducing current density at its wiring place.