EDDY CURRENT FLAW DETECTION PROBE

PROBLEM TO BE SOLVED: To provide an eddy current flaw detection probe not almost containing a noise component caused by lift-off in the output of a detection coil. SOLUTION: An exciting coil 1 is constituted by winding a coil winding 13 around the groove 12 provided to the outer periphery of an annu...

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Bibliographische Detailangaben
1. Verfasser:	HIROSHIMA TATSUO
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide an eddy current flaw detection probe not almost containing a noise component caused by lift-off in the output of a detection coil. SOLUTION: An exciting coil 1 is constituted by winding a coil winding 13 around the groove 12 provided to the outer periphery of an annular member 11, and the detection coil 2 is constituted by winding a coil winding 23 around the groove 22 provided to the outer periphery of a triangular plate-shaped triangle member. One side of the detection coil 2 is laid over the inside of the exciting coil 1 in the diametric direction of the exciting coil 1, the opposed apexes of one side are arranged so as to be spaced apart from the exciting coil 1, and the detection coil 2 is allowed to cross the exciting coil 2 at a right angle. The side surface of the exciting coil 1 on the side opposite to the opposed apexes is set as a flaw detection surfaces to be opposed to the surface of an object T to be used.