METHOD AND DEVICE FOR ANALYZING COMPLAINT OF PATENT INFORMATION

PROBLEM TO BE SOLVED: To provide a method and a device for complaint analysis of patent information which enable accurate analysis of an omission or the like, of a complaint for a patent application of the same technical genre. SOLUTION: The complaint analysis method for patent information comprises extracting an object patent information group meeting a prescribed condition from prescribed patent information and analyzing a complaint for the extracted patent information group; and all claims are extracted from the patent information in the object patent information group, complaint terms in phrase terms are generated according to the extracted complaints, and a constitution item list based upon the complaint terms is generated to analyze the complaints. Further, complaint term lists for each attribute and a complaint term list in at least one of a time series and the JIS order are generated according to the constitution item list.