METHOD AND INSTRUMENT FOR TWO-DIMENSIONALLY ACCURATELY MEASURING COMING FLYING DIRECTION OF GAMMA RAY

METHOD AND INSTRUMENT FOR TWO-DIMENSIONALLY ACCURATELY MEASURING COMING FLYING DIRECTION OF GAMMA RAY

PROBLEM TO BE SOLVED: To provide a two-dimensional accurate measuring instrument for coming flying direction of gamma ray which can obtain the accurate positional information on a gamma ray and is improved in resolution. SOLUTION: The measuring instrument is provided with a converter 2 which is cons...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WASHIO MASAICHI, KODERA MASATOSHI
Format: Patent
Sprache:eng
Schlagworte:
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a two-dimensional accurate measuring instrument for coming flying direction of gamma ray which can obtain the accurate positional information on a gamma ray and is improved in resolution. SOLUTION: The measuring instrument is provided with a converter 2 which is constituted by alternately laminating grid materials 4 each having many through holes 7 divided from each other by partition walls 4A and insulating materials 5 upon another. In each through hole 7, a hollow channel 8 is formed for passing electrons. The instrument is also provided with a two-dimensional electronic measuring instrument 3 on the bottom side of the converter 2.