LASER BEAM MEASURING DEVICE AND CONTROL DEVICE

PROBLEM TO BE SOLVED: To provide a handy device for measuring a characteristic of a high output laser beam in an in-process, particularly, a laser beam measuring device for measuring a characteristic of a vibrating pulse laser in a work position and a laser beam control device. SOLUTION: A part of t...

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Bibliographische Detailangaben
1. Verfasser:	MURO MIKIO
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CLADDING OR PLATING BY SOLDERING OR WELDING COLORIMETRY CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING DEVICES USING STIMULATED EMISSION ELECTRICITY MACHINE TOOLS MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING METAL-WORKING NOT OTHERWISE PROVIDED FOR PERFORMING OPERATIONS PHYSICS RADIATION PYROMETRY SOLDERING OR UNSOLDERING TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR TRANSPORTING WELDING WORKING BY LASER BEAM
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a handy device for measuring a characteristic of a high output laser beam in an in-process, particularly, a laser beam measuring device for measuring a characteristic of a vibrating pulse laser in a work position and a laser beam control device. SOLUTION: A part of the laser beam radiated from a laser oscillator 1 is taken out by a partial reflection transmission mirror 2 to be made incident on a plane vibrating mirror 3 for periodically rotating around the rotary axis, a reflecting measuring laser beam is made incident on an image pickup element 4 while swinging, and when drawing a locus similar to a Lissajous curve on an image pickup surface, a data analyzer 7 measures the characteristic of the laser beam on the basis of a received light quantity measuring signal on a laser beam locus of the image pickup surface, and a control device 8 controls the laser oscillator 1 or a galvanomirror 3 on the basis of the measured value.