MEASURING METHOD BY USING LABELED PARTICLE CONTAINING METAL OR METAL COMPOUND

MEASURING METHOD BY USING LABELED PARTICLE CONTAINING METAL OR METAL COMPOUND

PROBLEM TO BE SOLVED: To provide a measuring method and a measuring device capable of measuring easily a measuring object. SOLUTION: The measuring object is coupled with a labeled particle containing a metal or a metal compound through an antibody or an antigen coupled with the labeled particle, and...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: MUNEBAYASHI TAKAAKI, OOHIRAOCHI YOSHIHIRO
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a measuring method and a measuring device capable of measuring easily a measuring object. SOLUTION: The measuring object is coupled with a labeled particle containing a metal or a metal compound through an antibody or an antigen coupled with the labeled particle, and the metal quantity of the labeled particle coupled with the measuring object is measured by measuring an eddy current or a capacitance, to thereby measure the measuring object.