EVENT TYPE SEMICONDUCTOR TEST SYSTEM

PROBLEM TO BE SOLVED: To provide an event type test system in which two or more pin unit groups mutually independently perform test operations and which independently generates a plurality of signals for indicating finishing of a test correspondingly to each pin unit group. SOLUTION: This event type...

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Bibliographische Detailangaben
Hauptverfasser:	TURNQUIST JAMES ALAN, LE ANTHONY, RAJUSMAN ROCHIT, SUGAMORI SHIGERU
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide an event type test system in which two or more pin unit groups mutually independently perform test operations and which independently generates a plurality of signals for indicating finishing of a test correspondingly to each pin unit group. SOLUTION: This event type test system has a plurality of pin units assigned to a device pin to be tested, a test finishing signal generator for generating a signal for indicating finishing of the test for a corresponding pin unit independently of the other pin unit, and a system controller for controlling an entire operation of the event type test system. The test finishing signal for each pin unit is selected under a condition specified by the system controller, and the selected test finishing signal is supplied to the system controller and the other pin unit.