METHOD FOR MEASURING CONTENT OF TRACE AMOUNT OF ALUMINUM IN TANTALUM COMPOUND

PROBLEM TO BE SOLVED: To provide a method for measuring the content of a trace amount of aluminum in a tantalum compound, capable of obtaining reproducibility, even in an order of about sub-ppb (μg/l) and capable of accurately measuring the amount of a very small amount of aluminum in this order, an...

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Hauptverfasser:	MATSUSHITA MASAKATSU, KUDO TSUTOMU
Format:	Patent
Sprache:	eng
Schlagworte:	CHEMISTRY COMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSESC01D OR C01F INORGANIC CHEMISTRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING METALLURGY PHYSICS TESTING
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Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a method for measuring the content of a trace amount of aluminum in a tantalum compound, capable of obtaining reproducibility, even in an order of about sub-ppb (μg/l) and capable of accurately measuring the amount of a very small amount of aluminum in this order, and the tatalum compound of which the aluminum content is specified by this measuring method. SOLUTION: In the method for measuring the content of a trace small amount of aluminum in the tatalum compound, cobalt is used as an internal standard, and the content of aluminum in a tantalum-containing sample is analyzed by a standard addition method.