TEST SYSTEM FOR SEMICONDUCTOR

PROBLEM TO BE SOLVED: To provide a test system for semiconductor having means for detecting a glitch contained in the output signal from a device being tested in order to evaluate the characteristics thereof accurately. SOLUTION: The test system for semiconductor comprises an event memory storing th...

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Bibliographische Detailangaben
Hauptverfasser: TURNQUIST JAMES ALAN, LE ANTHONY, RAJUSMAN ROCHIT, SUGAMORI SHIGERU
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a test system for semiconductor having means for detecting a glitch contained in the output signal from a device being tested in order to evaluate the characteristics thereof accurately. SOLUTION: The test system for semiconductor comprises an event memory storing the timing data for the event of a signal for testing a device, an event generator generating a signal for testing a device, i.e., a test pattern, based on event data from the vent memory, a strobe signal and an expected value pattern, a pattern comparator for comparing the output signal from a pin electronics with the expected value pattern and generating an NG signal if they do not match each other, and a unit for detecting a glitch by counting the number of edges of the output signal and comparing it with an expected value.