DRY ETCHING APPARATUS AND METHOD OF TREATING SEMICONDUCTOR SUBSTRATE USING THE SAME

PROBLEM TO BE SOLVED: To solve problems of stability of reliability in wiring-forming process and in resist-stripping process where a metal-wiring layer is corroded by residual chlorine before treating with a chemical liquid or wherein reaction products formed by the reaction between etching gas and...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: MINO YOSHIKO
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!