CIRCUIT BOARD AND INSPECTION DEVICE FOR THE CIRCUIT BOARD

PROBLEM TO BE SOLVED: To provide a circuit board whose area of circuit pattern of boundary scan test is reduced. SOLUTION: The boundary scan test of the circuit board is conducted by way of a connection jig provided with a circuit pattern of testing.

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Bibliographische Detailangaben
Hauptverfasser:	SATO MASATAKE, YUKI KENTA, IGARASHI YUTAKA
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a circuit board whose area of circuit pattern of boundary scan test is reduced. SOLUTION: The boundary scan test of the circuit board is conducted by way of a connection jig provided with a circuit pattern of testing.