PLL SEMICONDUCTOR DEVICE, AND TESTING METHOD AND DEVICE THEREFOR

PROBLEM TO BE SOLVED: To shorten the required time for test, and to reduce the testing cost by further easily testing a PLL semiconductor device including a voltage control oscillator and a frequency divider. SOLUTION: Not only the voltage control oscillator 10A but also an R frequency divider 21, a...

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Bibliographische Detailangaben

1. Verfasser:	NIRAZUKA KIMITOSHI
Format:	Patent
Sprache:	eng
Schlagworte:	AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATIONOF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES BASIC ELECTRONIC CIRCUITRY ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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