METHOD OF MANUFACTURING INSULATED GATE SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To solve a problem in the conventional case wherein micronization of trench formation is indispensable when the cell density of a power MOSFET is improved, working dimension of a trench opening is limited to an optical limit of an aligner, and introduction of new installation i...

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Bibliographische Detailangaben
1. Verfasser: KUBO HIROTOSHI
Format: Patent
Sprache:eng
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