INTEGRATED CIRCUIT DEVICE

PROBLEM TO BE SOLVED: To provide an integrated circuit device which is capable of very accurately measuring the signal state of an optical electrode, provided in an integrated circuit by the use of an optoelectrical sampling technique. SOLUTION: Observation pads 106l, 106m, and 106n are varied in ar...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SHINAGAWA MITSURU, HASHIMOTO CHISATO
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!