INTEGRATED CIRCUIT DEVICE

INTEGRATED CIRCUIT DEVICE

PROBLEM TO BE SOLVED: To provide an integrated circuit device which is capable of very accurately measuring the signal state of an optical electrode, provided in an integrated circuit by the use of an optoelectrical sampling technique. SOLUTION: Observation pads 106l, 106m, and 106n are varied in ar...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SHINAGAWA MITSURU, HASHIMOTO CHISATO
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide an integrated circuit device which is capable of very accurately measuring the signal state of an optical electrode, provided in an integrated circuit by the use of an optoelectrical sampling technique. SOLUTION: Observation pads 106l, 106m, and 106n are varied in area, corresponding to signal intensities at wiring electrodes 103l, 103m, and 103n.