EMISSION SPECTROSCOPIC ANALYZER

PROBLEM TO BE SOLVED: To provide an emission spectroscopic analyzer capable of ensuring the enhancement and long-term stability of analyzing accuracy, while enabling the analysis of an element having an emission line in a low wavelength region by preventing the contamination of a condensing lens and...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SATO SHIGEOMI, MOCHIZUKI TADASHI, NAGASHIMA HITOSHI, YOSHIOKA YUTAKA
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide an emission spectroscopic analyzer capable of ensuring the enhancement and long-term stability of analyzing accuracy, while enabling the analysis of an element having an emission line in a low wavelength region by preventing the contamination of a condensing lens and the interior of a passage caused by an oil component, and suppressing generation of impurity gases. SOLUTION: An emission spectroscopic analyzer consists of a discharge chamber 1, a spectroscope 4 to which the spark light generated in the discharge chamber is guided, the cylindrical body 18 provided between the spark light outlet hole of the discharge chamber 1 and the spark light inlet hole of the spectroscope 4, the condensing lens 6 attached to the spark light outlet hole of the discharge chamber 1 and a heating means for heating the cylindrical body 18, and the condensing lens 6 is held to the lens holder 2 fixed to the spark light outlet hole of the discharge chamber 1 and one end surface of the cylindrical body 18 comes into contact with the end surface of the lens holder 22, and the length L of the passage formed by the cylindrical body 18 and the diameter D of the condensing lens are set such that 1.5