REVOLUTION DETECTION SENSOR

PROBLEM TO BE SOLVED: To provide a revolution detection sensor provided with a comparison circuit for shaping wave form based on a threshold set to stably be 50 vs 50 duty ratio in the case of a large output variation due to temperature characteristics. SOLUTION: A revolution member arranging each m...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	OGISO KATSUYA, TANIGUCHI MASAHIRO, NIIMI MASAHARU
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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