REVOLUTION DETECTION SENSOR

PROBLEM TO BE SOLVED: To provide a revolution detection sensor provided with a comparison circuit for shaping wave form based on a threshold set to stably be 50 vs 50 duty ratio in the case of a large output variation due to temperature characteristics. SOLUTION: A revolution member arranging each m...

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Bibliographische Detailangaben
Hauptverfasser:	OGISO KATSUYA, TANIGUCHI MASAHIRO, NIIMI MASAHARU
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a revolution detection sensor provided with a comparison circuit for shaping wave form based on a threshold set to stably be 50 vs 50 duty ratio in the case of a large output variation due to temperature characteristics. SOLUTION: A revolution member arranging each magnetic path changing piece in the revolution direction so that the ratio of length in the revolution direction of magnetic path changing pieces 6a to 6c and the length of spaces 7a to 7c in the revolution direction is set to be 40 vs 60, and a first to third magnetic detector 13 to 15 arranged in a specific direction to the revolution member, are provided. An output circuit for obtaining waveform output in detecting the revolution motion of the magnetic path changing pieces 6a to 6c is constituted and is connected to a comparison circuit for shaping wave form based on a threshold setting the output signal of the output circuit to be 1/4 of output change width and duty ratio to be 50 vs 50.