SCANNING TUNNELING MICROSCOPE EMISSION CONVERGING APPARATUS

PROBLEM TO BE SOLVED: To provide a scanning tunneling microscope emission converging apparatus having a higher light converging efficiency in a vacuum without impairing the high space resolution of an STM. SOLUTION: The scanning tunneling microscope emission converging apparatus includes a scanning...

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Bibliographische Detailangaben
Hauptverfasser:	ARAFUNE RYUICHI, SAKAMOTO KENJI, SHIODA SHISHO
Format:	Patent
Sprache:	eng
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a scanning tunneling microscope emission converging apparatus having a higher light converging efficiency in a vacuum without impairing the high space resolution of an STM. SOLUTION: The scanning tunneling microscope emission converging apparatus includes a scanning tunneling microscope and a plurality of optical fibers 2 arranged radially about the end of a scanning tunneling microscope probe 1 and around the scanning tunneling microscope probe 1 to converge emission caused by the operation of the scanning tunneling microscope.