NONCONTACT MEASURING DEVICE FOR LARGE SCALE INTEGRATED CIRCUIT

PROBLEM TO BE SOLVED: To provide an easy noncontact measuring device for an LSI capable of measuring an electrical potential fluctuation in a power wiring in the LSI even if a seal structure of the LSI is not removed. SOLUTION: The device 1 is provided with an antenna 20 for receiving a radiation el...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	AOYAMA SHINTARO
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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