IC INSPECTING APPARATUS

PROBLEM TO BE SOLVED: To provide an IC inspecting apparatus which can effectively acquire images of characters and images of leads affixed to ICs, and can also effectively reduce errors in recognition of IC positions followed by an edge part of an embossed tape. SOLUTION: Green light (λ=550 nm) is i...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	MUNEDA AKIHIKO
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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