IC INSPECTING APPARATUS

PROBLEM TO BE SOLVED: To provide an IC inspecting apparatus which can effectively acquire images of characters and images of leads affixed to ICs, and can also effectively reduce errors in recognition of IC positions followed by an edge part of an embossed tape. SOLUTION: Green light (λ=550 nm) is i...

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Bibliographische Detailangaben
1. Verfasser:	MUNEDA AKIHIKO
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide an IC inspecting apparatus which can effectively acquire images of characters and images of leads affixed to ICs, and can also effectively reduce errors in recognition of IC positions followed by an edge part of an embossed tape. SOLUTION: Green light (λ=550 nm) is irradiated from a character lighting 14 from an oblique direction of an IC package 19, and red light (λ=650 nm) is irradiated from a lead lighting 15 from upward of the IC package 19, and there are provided a filter 16 which transmits the red light and absorbs or reflects the green light and a filter 17 which transmits the green light and absorbs or reflects the red light, and it is possible to set independently the illumination conditions of the character 14 and illumination conditions of the lead illumination 15.